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Seminar presented by Dr Hoang Van Thai, postdoctorant at University of Strasbourg, France - Date: Wednesday 4 March 2015, 15h00 - Location: seminar room, MICA Institute, Hanoi University of Science and Technology
Dr Hoang Van Thai, postdoctorant at University of Strasbourg, France
Date : Wednesday 4 March 2015, 15h00
Location: "seminar room", 9th floor, B1 building, MICA Institute, Hanoi University of Science and Technology
Language: the seminar will be presended in English
FIB-SEM imaging combines scanning electron microscope (SEM) visualization with focused ion beam (FIB) milling and is becoming the method of choice to elucidate the 3D organization of the cellular architecture. However, this new technology has some inherent limitations due to the milling and scanning processes that may cause defects in the obtained image stacks. The first type of defects are curtaining effects which appear as vertical ripples from top to bottom of the SEM image. The second type appears in SEM images as horizontal irregular strips with inhomogeneous change in intensity values when compared to the preceding image in the stack. A third defect is revealed by an image deformation which results from specimen drifting during SEM image acquisition. In this work, we propose solutions to correct these defects by using Fourier analysis and correlation-based local deformation estimation to improve the visual quality of FIB-SEM data and to facilitate the segmentation of organelles and the subsequent extraction of quantitative information. The efficiency of the proposed correction solutions for FIB-SEM images of biological samples is demonstrated through a number of experiments.